Notice: Undefined variable: meta in /home/customer/www/ on line 1116

Deprecated: implode(): Passing glue string after array is deprecated. Swap the parameters in /home/customer/www/ on line 94
IEEE paper by Emertxe alumni

Emertxe-News & Blog

Home » Embedded » IEEE paper by Emertxe Alumni
IEEE paper by Emertxe Alumni
IEEE paper by Emertxe alumniIt always feels great to see our alumni’s accomplishment in the field of technology. One of our recent alumnus from embedded systems training Mr. Lokesh Jaliminche has published a  paper in IEEE conference. Details are provided below. Team Emertxe congratulates this accomplishment and wish him all the best for future achievements.

The abstract and IEEE URL is provided below, will share the full version of the paper shortly.


Design and implementation of test harness for device drivers in SOC on mobile platforms


Modern SOCs are comprised of a wide range of modules, such as microprocessor cores, memories, peripherals, and customized components, relevant to the targeted application. Testing external peripherals is easy, but testing embedded peripherals in SOC is challenging task. In order to efficiently carry out design verification of peripheral cores, it is necessary to evaluate device under test with functional coverage metrics. The overall process can be divided in to two closely correlated phases mainly module configuration and module operation. The first one configures the peripheral on the different operation modes, the second one is responsible for exciting the whole device and observing its behavior. In the current work, we propose to develop a test harness for DMA controller and High Speed Synchronous Serial Interface. This proposed test harness can be used for stimulating the distinct functionalities of device under test as well as used for behavioral analysis. We have developed test drivers which can be exploited for testing by adding suitable observability features. Experimental results are provided with suitable functional test coverage to evaluate effectiveness of this test harness.

IEEE reference URL:

Best Embedded systems training institute with placements in Bangalore.


The Future of Embedded Systems : Trends and Predictions

The Future of Embedded Systems : Trends and Predictions

Introduction Embedded systems have become an integral part of modern technology, and their importance is increasing day by day. These systems are designed to perform specific tasks and are embedded in everyday devices, making them intelligent and interactive. From...

Online Free IoT Internship for Engineering Students – 2023

Online Free IoT Internship for Engineering Students – 2023

The Internship Ecosystem An internship is a type of professional learning opportunity where engineering students get practical work related to their field of study or career interest. Through an internship, a student can explore and advance their career while...


Submit a Comment

Your email address will not be published. Required fields are marked *